High numerical aperture reflection mode coherent diffraction microscopy using off-axis apertured illumination
Gardner, Dennis F., Zhang, Bosheng, Seaberg, Matthew D., Martin, Leigh S., Adams, Daniel E., Salmassi, Farhad, Gullikson, Eric, Kapteyn, Henry, Murnane, MargaretVolume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.20.019050
Date:
August, 2012
File:
PDF, 1.20 MB
english, 2012