SPIE Proceedings [SPIE SPIE Defense + Security - Baltimore, Maryland, United States (Monday 20 April 2015)] Optical Pattern Recognition XXVI - Image registration under symmetric conditions: novel approach
Casasent, David, Alam, Mohammad S., Duraisamy, Prakash, Yousef, Amr, Buckles, Bill, Jackson, SteveVolume:
9477
Year:
2015
Language:
english
DOI:
10.1117/12.2179093
File:
PDF, 433 KB
english, 2015