Nanometer level characterization of the James Webb Space...

Applied Optics 2015 / 05 Vol. 54; Iss. 13

Nanometer level characterization of the James Webb Space Telescope optomechanical systems using high-speed interferometry

Saif, Babak, Chaney, David, Scott Smith, W., Greenfield, Perry, Hack, Warren, Bluth, Josh, Otten, Austin Van, Bluth, Marcel, Sanders, James, Keski-Kuha, Ritva, Feinberg, Lee, North-Morris, Michael, Mi
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Volume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.54.004285
Date:
May, 2015
File:
PDF, 3.56 MB
english, 2015
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