Ellipsometry with randomly varying polarization states

Optics Express 2012 / 01 Vol. 20; Iss. 2

Ellipsometry with randomly varying polarization states

Liu, Feng, Lee, Chris J., Chen, Juequan, Louis, Eric, van der Slot, Peter J. M., Boller, Klaus J., Bijkerk, Fred
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Volume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.20.000870
Date:
January, 2012
File:
PDF, 1011 KB
english, 2012
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