Quantitative sectioning and noise analysis for structured...

Optics Express 2012 / 02 Vol. 20; Iss. 5

Quantitative sectioning and noise analysis for structured illumination microscopy: errata

Hagen, Nathan, Gao, Liang, Tkaczyk, Tomasz S.
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Volume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.20.005343
Date:
February, 2012
File:
PDF, 560 KB
english, 2012
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