Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films
Rodenhausen, Keith B., Schmidt, Daniel, Kasputis, Tadas, Pannier, Angela K., Schubert, Eva, Schubert, MathiasVolume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.20.005419
Date:
February, 2012
File:
PDF, 1.45 MB
english, 2012