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Real space soft x-ray imaging at 10 nm spatial resolution
Chao, W., Fischer, P., Tyliszczak, T., Rekawa, S., Anderson, E., Naulleau, P.Volume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.20.009777
Date:
April, 2012
File:
PDF, 1.33 MB
english, 2012