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Profile estimation for Pt submicron wire on rough Si substrate from experimental data
Karamehmedović, Mirza, Hansen, Poul-Erik, Dirscherl, Kai, Karamehmedovi, Emir, Wriedt, ThomasVolume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.20.021678
Date:
September, 2012
File:
PDF, 1.59 MB
english, 2012