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Analysis on enhanced depth of field for integral imaging microscope
Lim, Young-Tae, Park, Jae-Hyeung, Kwon, Ki-Chul, Kim, NamVolume:
20
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.20.023480
Date:
October, 2012
File:
PDF, 1.20 MB
english, 2012