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Using a quartz paraboloid for versatile wide-field TIR microscopy with sub-nanometer localization accuracy
Schneider, René, Glaser, Tilman, Berndt, Michael, Diez, StefanVolume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.21.003523
Date:
February, 2013
File:
PDF, 5.24 MB
english, 2013