Robustness of Lorenz-Mie microscopy against defects in...

Robustness of Lorenz-Mie microscopy against defects in illumination

Moyses, Henrique W., Krishnatreya, Bhaskar J., Grier, David G.
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Volume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.21.005968
Date:
March, 2013
File:
PDF, 862 KB
english, 2013
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