![](/img/cover-not-exists.png)
Robustness of Lorenz-Mie microscopy against defects in illumination
Moyses, Henrique W., Krishnatreya, Bhaskar J., Grier, David G.Volume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.21.005968
Date:
March, 2013
File:
PDF, 862 KB
english, 2013