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Two-photon excitation selective plane illumination microscopy (2PE-SPIM) of highly scattering samples: characterization and application
Lavagnino, Zeno, Zanacchi, Francesca Cella, Ronzitti, Emiliano, Diaspro, AlbertoVolume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.21.005998
Date:
March, 2013
File:
PDF, 2.22 MB
english, 2013