Mlines characterization of the refractive index profile of...

Mlines characterization of the refractive index profile of SiGe gradient waveguides at 215 µm

Barritault, Pierre, Brun, Mickael, Labeye, Pierre, Lartigue, Olivier, Hartmann, Jean-Michel, Nicoletti, Sergio
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Volume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.21.011506
Date:
May, 2013
File:
PDF, 1.72 MB
english, 2013
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