X-ray phase contrast imaging and noise evaluation using a single phase grating interferometer
Rizzi, J., Mercère, P., Idir, M., Silva, P. Da, Vincent, G., Primot, JérômeVolume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.21.017340
Date:
July, 2013
File:
PDF, 1.42 MB
english, 2013