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Parametric model of the Mueller matrix of a Spectralon white reflectance standard deduced by polar decomposition techniques
Kildemo, Morten, Maria, Jérôme, Ellingsen, Pål G., Aas, Lars M. S.Volume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.21.018509
Date:
July, 2013
File:
PDF, 2.33 MB
english, 2013