A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description
Yue, Huimin, Wu, Yuxiang, Zhao, Biyu, Ou, Zhonghua, Liu, Yongzhi, Liu, YongVolume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.21.021756
Date:
September, 2013
File:
PDF, 1.87 MB
english, 2013