Investigations on single and multiple pulse laser-induced damages in HfO_2/SiO_2 multilayer dielectric films at 1064 nm
Liu, Wenwen, Wei, Chaoyang, Wu, Jianbo, Yu, Zhenkun, Cui, Hui, Yi, Kui, Shao, JiandaVolume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.21.022476
Date:
September, 2013
File:
PDF, 4.10 MB
english, 2013