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Nanoscale contact line visualization based on total internal reflection fluorescence microscopy
Franken, M.J.Z., Poelma, C., Westerweel, J.Volume:
21
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.21.026093
Date:
November, 2013
File:
PDF, 1.22 MB
english, 2013