Wavefront metrology measurements at SACLA by means of X-ray...

Wavefront metrology measurements at SACLA by means of X-ray grating interferometry

Kayser, Yves, Rutishauser, Simon, Katayama, Tetsuo, Ohashi, Haruhiko, Kameshima, Takashi, Flechsig, Uwe, Yabashi, Makina, David, Christian
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Volume:
22
Journal:
Optics Express
DOI:
10.1364/OE.22.009004
Date:
April, 2014
File:
PDF, 2.11 MB
2014
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