Wavefront metrology measurements at SACLA by means of X-ray grating interferometry
Kayser, Yves, Rutishauser, Simon, Katayama, Tetsuo, Ohashi, Haruhiko, Kameshima, Takashi, Flechsig, Uwe, Yabashi, Makina, David, ChristianVolume:
22
Journal:
Optics Express
DOI:
10.1364/OE.22.009004
Date:
April, 2014
File:
PDF, 2.11 MB
2014