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Sparse-view computed laminography with a spherical sinusoidal scan for nondestructive testing
Abbas, Sajid, Park, Miran, Min, Jonghwan, Kim, Ho Kyung, Cho, SeungryongVolume:
22
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.22.017745
Date:
July, 2014
File:
PDF, 1.61 MB
english, 2014