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An exact surface-integral approach for accurate interferometric microscopy of single nanoparticles
Little, Douglas J., Hawkins, S. C., Kane, Deb M.Volume:
23
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.23.006228
Date:
March, 2015
File:
PDF, 1.31 MB
english, 2015