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Achromatic and high-resolution full-field X-ray microscopy based on total-reflection mirrors
Matsuyama, Satoshi, Emi, Yoji, Kino, Hidetoshi, Kohmura, Yoshiki, Yabashi, Makina, Ishikawa, Tetsuya, Yamauchi, KazutoVolume:
23
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.23.009746
Date:
April, 2015
File:
PDF, 2.71 MB
english, 2015