Rapid super-resolution line-scanning microscopy through virtually structured detection
Zhi, Yanan, Lu, Rongwen, Wang, Benquan, Zhang, Qiuxiang, Yao, XinchengVolume:
40
Language:
english
Journal:
Optics Letters
DOI:
10.1364/ol.40.001683
Date:
April, 2015
File:
PDF, 556 KB
english, 2015