[IEEE 2015 20th International Mixed-Signal Testing Workshop (IMSTW) - Paris, France (2015.6.24-2015.6.26)] 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) - A CAD integrated solution of substrate modeling for industrial IC design
Zou, Hao, Moursy, Yasser, Iskander, Ramy, Chaput, Jean-Paul, Louerat, Marie-Minerve, Stefanucci, Camillo, Buccela, Pietro, Kayal, Maher, Sallese, Jean-Michel, Gneiting, Thomas, Alius, Heidrun, SteinmaYear:
2015
Language:
english
DOI:
10.1109/IMS3TW.2015.7177885
File:
PDF, 326 KB
english, 2015