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Real-time automated counterfeit integrated circuit detection using x-ray microscopy
Mahmood, Kaleel, Carmona, Pedro Latorre, Shahbazmohamadi, Sina, Pla, Filiberto, Javidi, BahramVolume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.54.000d25
Date:
May, 2015
File:
PDF, 1.08 MB
english, 2015