A Novel Layout-Based Single Event Transient Injection...

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A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology

Du, Yankang, Chen, Shuming
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2015.2427372
File:
PDF, 1.11 MB
english, 2015
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