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SPIE Proceedings [SPIE SPIE Optical Systems Design - Jena, Germany (Monday 7 September 2015)] Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V - Design and development of a profilometer for the fast and accurate characterization of optical surfaces
Duparré, Angela, Geyl, Roland, Gómez-Pedrero, José A., Rodríguez-Ibañez, Diego, Alonso, José, Quirgoa, Juan A.Volume:
9628
Year:
2015
Language:
english
DOI:
10.1117/12.2191058
File:
PDF, 1.10 MB
english, 2015