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[OSA CLEO: QELS_Fundamental Science - San Jose, California (2015..-..)] CLEO: 2015 - Beam Deflection Measurements of Nondegenerate Nonlinear Refractive Indices in Direct-gap Semiconductors

Zhao, Peng, Reichert, Matthew, Ensley, Trenton, Hagan, David J., Van Stryland, Eric W.
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Year:
2015
Language:
english
DOI:
10.1364/cleo_qels.2015.fw3d.7
File:
PDF, 408 KB
english, 2015
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