[OSA CLEO: QELS_Fundamental Science - San Jose, California (2015..-..)] CLEO: 2015 - Beam Deflection Measurements of Nondegenerate Nonlinear Refractive Indices in Direct-gap Semiconductors
Zhao, Peng, Reichert, Matthew, Ensley, Trenton, Hagan, David J., Van Stryland, Eric W.Year:
2015
Language:
english
DOI:
10.1364/cleo_qels.2015.fw3d.7
File:
PDF, 408 KB
english, 2015