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[IEEE 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Portland, OR, USA (2003.10.25-2003.10.25)] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Radiation hardness improved CMOS sensors as particle detectors in high energy physics and medical applications
Dulinski, W., Berst, D., Besson, A., Claus, G., Colledani, C., Deptuch, G., Deveaux, M., Gay, A., Grandjean, D., Gornushkin, Y., Himmi, A., Hu, C., Riester, J.L., Valin, I., Winter, M.Year:
2003
Language:
english
DOI:
10.1109/NSSMIC.2003.1352053
File:
PDF, 644 KB
english, 2003