SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Optical Measurement Systems for Industrial Inspection VIII - Lensless single-exposure super-resolved interferometric microscopy
Granero, Luis, Lehmann, Peter H., Osten, Wolfgang, Ferreira, Carlos, García, Javier, Albertazzi, Armando, Micó, VicenteVolume:
8788
Year:
2013
Language:
english
DOI:
10.1117/12.2020580
File:
PDF, 1.05 MB
english, 2013