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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] Earth Observing Systems XX - Assessment of scan-angle dependent radiometric bias of Suomi-NPP VIIRS day/night band from night light point source observations
Butler, James J., Xiong, Xiaoxiong (Jack), Gu, Xingfa, Bai, Yan, Cao, Changyong, Shao, XiVolume:
9607
Year:
2015
Language:
english
DOI:
10.1117/12.2187119
File:
PDF, 574 KB
english, 2015