3-D shape measurement by self-referenced pattern projection method
Sonko Osawa, Ryoshu Furutani, Kiyoshi Takamasu, Shigeo Ozono, Hidemitsu AsanoVolume:
26
Year:
1999
Language:
english
Pages:
10
DOI:
10.1016/s0263-2241(99)00029-9
File:
PDF, 1.04 MB
english, 1999