Subnanometer absolute displacement measurement using a frequency comb referenced dual resonance tracking Fabry–Perot interferometer
Zhu, Minhao, Wei, Haoyun, Zhao, Shijie, Wu, Xuejian, Li, YanVolume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.54.004594
Date:
May, 2015
File:
PDF, 752 KB
english, 2015