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[IEEE 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - San Diego, CA, USA (2015.5.26-2015.5.29)] 2015 IEEE 65th Electronic Components and Technology Conference (ECTC) - Relative and absolute warpage modeling on molded packages
Zheng, Jiantao, Zhou, Eric, Wang, Lejun, Aldrete, Manuel, Kumar, Rajneesh, Syed, AhmerYear:
2015
Language:
english
DOI:
10.1109/ECTC.2015.7159802
File:
PDF, 1.37 MB
english, 2015