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An Experimental Perspective of Trap Generation Under BTI Stress
Mukhopadhyay, Subhadeep, Mahapatra, SouvikVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2434955
Date:
July, 2015
File:
PDF, 2.64 MB
english, 2015