An Experimental Perspective of Trap Generation Under BTI...

IEEE Transactions on Electron Devices 2015 / 7 Vol. 62; Iss. 7

An Experimental Perspective of Trap Generation Under BTI Stress

Mukhopadhyay, Subhadeep, Mahapatra, Souvik
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2434955
Date:
July, 2015
File:
PDF, 2.64 MB
english, 2015
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