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Full-Swing Local Bitline SRAM Architecture Based on the 22-nm FinFET Technology for Low-Voltage Operation
Kang, Kyoman, Jeong, Hanwool, Yang, Younghwi, Park, Juhyun, Kim, Kiryong, Jung, andSeong-OokYear:
2015
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2015.2450500
File:
PDF, 2.42 MB
english, 2015