Effective bias removal for fringe projection profilometry using the dual-tree complex wavelet transform
Ng, William Wai-Lam, Lun, Daniel Pak-KongVolume:
51
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.51.005909
Date:
August, 2012
File:
PDF, 1.35 MB
english, 2012