Correction to Nanofilament Formation and Regeneration During Cu/Al 2 O 3 Resistive Memory Switching
Hubbard, William A., Kerelsky, Alexander, Jasmin, Grant, White, E. R., Lodico, Jared, Mecklenburg, Matthew, Regan, B. C.Volume:
15
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.5b02648
Date:
August, 2015
File:
PDF, 103 KB
2015