Complex Internal Bias Fields in Ferroelectric Hafnium Oxide

Complex Internal Bias Fields in Ferroelectric Hafnium Oxide

Schenk, Tony, Hoffmann, Michael, Ocker, Johannes, Pešić, Milan, Mikolajick, Thomas, Schroeder, Uwe
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Volume:
7
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.5b05773
Date:
September, 2015
File:
PDF, 3.43 MB
english, 2015
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