Electronic properties of Co2MnSi thin films studied by hard x-ray photoelectron spectroscopy
S. Ouardi, A. Gloskovskii, B. Balke, C. A. Jenkins, J. Barth, G. H. Fecher, C. Felser, M. Gorgoi, M. Mertin, F. Schäfers, E. Ikenaga, K. Yang, K. Kobayashi, T. Kubota, M. Oogane, Y. AndoYear:
2009
Language:
english
DOI:
10.1088/0022-3727/42/8/084011
File:
PDF, 953 KB
english, 2009