Incidence ofin situannealing on the nanoscale...

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Incidence ofin situannealing on the nanoscale topographical/electrical properties of the tunnel barrier in sputtered epitaxial Fe/MgO/Fe multilayers

D. J. Kim, J. Arabski, V. D. Costa, G. Schmerber, M. Bowen, S. Boukari, E. Beaurepaire
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Year:
2010
Language:
english
DOI:
10.1088/0022-3727/43/21/215003
File:
PDF, 646 KB
english, 2010
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