Thermal Conductivity Measurement of Submicron-Thick...

Chinese Physics Letters 2008 / 02 Vol. 25; Iss. 2

Thermal Conductivity Measurement of Submicron-Thick Aluminium Oxide Thin Films by a Transient Thermo-Reflectance Technique

Su-Yuan, Bai, Zhen-An, Tang, Zheng-Xing, Huang, Jun, Yu, Jia-Qi, Wang
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Volume:
25
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/25/2/065
Date:
February, 2008
File:
PDF, 304 KB
english, 2008
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