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Impact of Band-Engineering to Performance of High- k Multilayer Based Charge Trapping Memory
Liu, Li-Fang, Pan, Li-Yang, Zhang, Zhi-Gang, Xu, JunVolume:
32
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/32/8/088501
Date:
August, 2015
File:
PDF, 637 KB
english, 2015