A ballistic electron emission microscopy (BEEM) study of...

Semiconductor Science and Technology 1995 / 04 Vol. 10; Iss. 4

A ballistic electron emission microscopy (BEEM) study of the barrier height change of Au/n-GaAs Schottky contacts due to mechanical polishing

Everaert, J L, Meirhaeghe, R L Van, Laflere, W H, Cardon, F
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Volume:
10
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/10/4/021
Date:
April, 1995
File:
PDF, 314 KB
english, 1995
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