Charge trapping and built-in field studies in...

Semiconductor Science and Technology 1996 / 04 Vol. 11; Iss. 4

Charge trapping and built-in field studies in electroreflectance of a GaAs structure

Mioc, S L, Garland, J W, Bennett, B R
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Volume:
11
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/11/4/010
Date:
April, 1996
File:
PDF, 130 KB
english, 1996
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