Back-to-back Schottky diode adopted for the measurement of...

Semiconductor Science and Technology 2005 / 06 Vol. 20; Iss. 6

Back-to-back Schottky diode adopted for the measurement of GaN films and its Schottky contacts

Luo, Qian, Du, Jiangfeng, Yang, Mohua, Wang, Liangchen, Jin, Tong, Yu, Qi
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Volume:
20
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/20/6/021
Date:
June, 2005
File:
PDF, 159 KB
english, 2005
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