Spectromicroscopic investigation of lateral-type Ge...

Semiconductor Science and Technology 2009 / 10 Vol. 24; Iss. 10

Spectromicroscopic investigation of lateral-type Ge 2 Sb 2 Te 5 device failure

Hong, Sung-Hoon, Bae, Byeong-Ju, Lee, Heon, Jung, Min-Cherl, Shin, Hyun-Joon
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Volume:
24
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/24/10/105025
Date:
October, 2009
File:
PDF, 700 KB
english, 2009
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