A scaling consideration on mechanical stress-induced hot-carrier effects
Hamada, A, Furusawa, T, Saito, N, Takeda, EVolume:
7
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/7/3B/156
Date:
March, 1992
File:
PDF, 233 KB
english, 1992