Decay pathways after Xe 3d inner shell ionization using a...

Decay pathways after Xe 3d inner shell ionization using a multi-electron coincidence technique

Suzuki, I H, Hikosaka, Y, Shigemasa, E, Lablanquie, P, Penent, F, Soejima, K, Nakano, M, Kouchi, N, Ito, K
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Volume:
44
Language:
english
Journal:
Journal of Physics B: Atomic, Molecular and Optical Physics
DOI:
10.1088/0953-4075/44/7/075003
Date:
April, 2011
File:
PDF, 1.09 MB
english, 2011
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