Structural characterization of 6H- and 4H-SiC polytypes by means of cathodoluminescence and x-ray topography
Ottaviani, L, Hidalgo, P, Idrissi, H, Lancin, M, Martinuzzi, S, Pichaud, BVolume:
16
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/16/2/013
Date:
January, 2004
File:
PDF, 623 KB
english, 2004